Patent · US Active

Method and system for error compensation

US8000435B2 · kind B2 · utility

9Cited by

10References

20Claims

0Family size

Assignee

KONINKLIJKE PHILIPS ELECTRONICS NV · NL

Inventors

Matthias Bertram · Aachen, DE
Jens Wiegert · Aachen, DE
Steffen Gunther Wiesner · Amsterdam, NL

Key dates

Filing date	Nov 25, 2009
Grant date	Aug 16, 2011
Priority date	—
Expiry date	Nov 25, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG06T11/005
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method includes generating a plurality of scatter distributions based on geometric models having different object to detector distances, determining an imaged object to detector distance, and identifying a scatter distribution of the plurality of scatter distributions having a object to detector distance that corresponds to the imaged object to detector distance. The method also includes employing the identified scatter distribution to scatter correct projection data corresponding to the imaged object. Another method includes generating an estimate of wedge scatter by propagating a predetermined wedge scatter profile through an intermediate reconstruction of an object; and employing the estimate to wedge scatter correct the projection data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.