Automatic detection of coating flaws
US8000515B2 · kind B2 · utility
0Cited by
16References
12Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 17, 2007 |
| Grant date | Aug 16, 2011 |
| Priority date | — |
| Expiry date | Apr 26, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/35
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and a device for inspecting surface coatings on workpieces, in particular of lacquer coatings, using an image capture and/or image processing system. The image capture and/or image processing system is designed to measure and/or process electromagnetic radiation from surface coating and/or a layer beneath it which is at least partially outside of the visible wavelength range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.