System for simplified correlation of instrumentation probes and data displays
US8004273B1 · kind B1 · utility
2Cited by
9References
19Claims
0Family size
Assignee
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Key dates
| Filing date | Jun 26, 2008 |
| Grant date | Aug 23, 2011 |
| Priority date | — |
| Expiry date | Jan 31, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for testing a device under test includes a probe that detects a signal from the device under test, a display device that depicts a trace based on the signal, where the trace exhibits an attribute, and an indicator that emits an indication signal based on the attribute.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.