Methods and apparatus for testing of high dielectric capacitors
US8004288B1 · kind B1 · utility
6Cited by
4References
20Claims
0Family size
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Key dates
| Filing date | May 13, 2008 |
| Grant date | Aug 23, 2011 |
| Priority date | — |
| Expiry date | May 15, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/64
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present subject matter provides apparatus and methods for testing high dielectric capacitors. A testing process whereby voltage and temperature is varied to provide temperature dependent plots to determine the reliability of a capacitor is provided. A testing system is demonstrated to measure capacitor reliability and/or relative capacitor reliability.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.