Patent · US Active

Cantilever probe structure for a probe card assembly

US8004299B2 · kind B2 · utility

1Cited by

6References

10Claims

0Family size

Assignee

SV Probe Pte. Ltd. · SG

Inventors

Scott Williams · St. George, US
Edward Laurent · North Wales, US
David T. Beatson · Kennett Square, US
Bahadir Tunaboylu · Chandler, US
Edward L. Malantonio · Conshohocken, US

Key dates

Filing date	Mar 1, 2011
Grant date	Aug 23, 2011
Priority date	—
Expiry date	Mar 1, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06727
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the fulcrum.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.