Apparatus and method for spectrophotometric analysis
US8004670B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 13, 2006 |
| Grant date | Aug 23, 2011 |
| Priority date | — |
| Expiry date | Dec 9, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/036
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for spectrophotometric analysis comprises a sample reception surface, which is arranged to receive a sample to be analysed, and a sample contacting surface, which is moveable in relation to the sample reception surface such that it may be brought to a first position, where the surfaces are sufficiently far apart to allow the sample to be placed on the sample reception surface, and a second position, where the sample contacting surface makes contact with the sample and compresses the sample. The apparatus further comprises a sample thickness controller, which is arranged to control the distance between the sample reception surface and the sample contacting surface in the second position of the sample contacting surface, such that a sample thickness between the surfaces may be shifted for obtaining at least two measurements of the sample at different optical path lengths through the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.