System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station
US8004694B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 27, 2009 |
| Grant date | Aug 23, 2011 |
| Priority date | — |
| Expiry date | Jan 16, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part such as an ammunition case based on direct measurements of the part when fixtured at a measurement station is provided. The system includes first and second holding devices for holding the part therebetween in a part-retaining position in which the part is firmly held between the devices at its end surfaces. In one embodiment, a portion of each of the holding devices extends into its respective opening in the part-retaining position. The system also includes a head apparatus which has a plurality of radiation sources for successively directing arrays of planes of radiation at the holding devices and at the part, and a plurality of receiver modules for measuring the amount of radiation present in unobstructed planar portions of the planes to obtain holding device and part signals. The system further includes a movable stage subsystem coupled to the head apparatus for translating the head apparatus. The system still further includes a signal processor for processing the holding device and part signals to obtain data and a data processor for processing the data to o…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.