System and method for intelligently analyzing performance of a device under test
US8004994B1 · kind B1 · utility
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13Claims
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Key dates
| Filing date | Nov 1, 2006 |
| Grant date | Aug 23, 2011 |
| Priority date | — |
| Expiry date | Sep 30, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/203
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A method and apparatus is provided that enables accurate measurement of drop rate and delay in a System Under Test (SUT) by one or more monitoring devices even when the frame error rate of the monitoring devices may be imperfect. During a packet drop measurement process, ancillary information is identified and analyzed to determine if the ancillary information can be used to infer receipt of packets when explicit information regarding receipt is not present. A delay measurement process incorporates the time required to re-transmit packets into the delay measurement to more accurately reflect SUT operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.