Method to determine phase and/or amplitude between interfering, adjacent x-ray beams in a detector pixel in a talbot interferometer

US8005185B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventor

• Stefan Popescu · Erlangen, DE

Key dates

• Filing date: Sep 24, 2009
• Grant date: Aug 23, 2011
• Expiry date: Dec 18, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G21K2207/005
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

In a method to determine phase and/or amplitude between interfering, adjacent x-ray beams in a detector pixel in a Talbot interferometer for projective and tomographical x-ray phase contrast imaging and/or x-ray dark field imaging, after an irradiation of the examination subject with at least two coherent or quasi-coherent x-rays, an interference of the at least two coherent or quasi-coherent x-rays with the aid of an irradiated phase grating is generated, and the variation of multiple intensity measurements in temporal succession after an analysis grating is determined in relation to known displacements of one of the gratings or of an x-ray source fashioned like a grating, positioned upstream in the beam path, relative to one of the gratings. The integrating intensity measurements ensue during a relative movement—thus not during the standstill—of one of the upstream gratings or of the x-ray source fashioned like a grating or of the examination subject, with known speed behavior over a final time interval of a final distance.