Method and device for preparing an implant from an implant material
US8005282B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 30, 2008 |
| Grant date | Aug 23, 2011 |
| Priority date | — |
| Expiry date | May 29, 2030 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61F2002/4632
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method and device for preparing an implant from an implant material are provided. A defect image of the defect which has a defect contour is made available, in which a first calibration member arranged in or adjacent to the defect is displayed. A second calibration member is arranged on or adjacent to the implant material to be processed, this second calibration member corresponding to the first calibration member. A real-time image of the implant material is displayed on a display device. The defect image is displayed on the display device and superimposed on the real-time image so that the first and the second calibration members are displayed one on top of the other. A processing tool is displayed on the display device in the real-time image and moved over the implant material so that it follows the defect contour displayed in the defect image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.