Patent · US Active

Screening of silicon wafers used in photovoltaics

US8006566B2 · kind B2 · utility

4Cited by
14References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 28, 2006
Grant dateAug 30, 2011
Priority date
Expiry dateOct 16, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/9503
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.