X-ray CT system to generate tomographic phase contrast or dark field exposures

US8009796B2 · kind B2 · utility

Assignees

• Siemens Aktiengesellschaft · DE
• Paul Scherrer Institut · CH

Inventors

• Stefan Popescu · Erlangen, DE
• Christian David · Lauchringen, DE
• Tilman Donath · Brugg, CH
• Eckhard Hempel · Bad Mergentheim, DE
• Martin Hoheisel · Erlangen, DE
• Franz Pfeiffer · Unterföhring, DE

Key dates

• Filing date: Sep 24, 2009
• Grant date: Aug 30, 2011
• Expiry date: Dec 12, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G21K2207/005
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

An x-ray CT system that generates tomographic phase contrast or dark field exposures, has at least one grating interferometer with three grating structures arranged in series in the radiation direction, with a modular design of the second and third grating structures. The distance between the first grating structure of the x-ray source and the second grating structure (fashioned as a phase grating) of the respective grating/detector modules is adapted, depending on the fan angle, corresponding to a period of the grating structure of the x-ray source projected onto the grating detector module at a respective fan angle (φi).