Apparatus and method for measuring thickness of ink layer in pixel
US8011749B2 · kind B2 · utility
1Cited by
2References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 20, 2008 |
| Grant date | Sep 6, 2011 |
| Priority date | — |
| Expiry date | Jun 30, 2030 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB41J29/393
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
Provided are an apparatus and method for measuring the thickness of an ink layer in a pixel and a method of controlling nozzles of an inkjet head using the apparatus and method. The apparatus includes: a substrate; a plurality of pixels disposed on the substrate and filled with ink due to a printing operation; first and second electrodes corresponding to the pixels, the first and second electrodes disposed on opposite sides of each of the pixels; and a capacitance measurement circuit electrically connected to the first and second electrodes to measure the capacitance of each of the pixels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.