Optical alignment apparatus and method therefor
US8011785B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 29, 2008 |
| Grant date | Sep 6, 2011 |
| Priority date | — |
| Expiry date | Jul 29, 2028 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/14532
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An optical measurement apparatus comprises an optical system. The optical system comprises a source and an image capture device. The source is arranged to generate, when in use, a beam of electromagnetic radiation. Further, the optical system is arranged to direct the beam of electromagnetic radiation to a location to be measured. The optical measurement apparatus also comprises a feedback arrangement arranged to receive a reflected beam from the location to be measured and to provide feedback information in response to receipt of the reflected beam, the feedback information being indicative of degree of alignment of the location to be measured with the optical system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.