Particle state and flux sensor
US8013994B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2008 |
| Grant date | Sep 6, 2011 |
| Priority date | — |
| Expiry date | May 18, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2005/0077
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring parameters of a particle includes providing a particle, wherein the particle has a first portion and a second portion. The process includes providing a column of photo-detectors including a first photo-detector and a second photo-detector, wherein the first photo-detector and the second photo-detector are sensitive to the same range of light frequencies. Light is projected from the particle onto the column of photo-detectors wherein the column of photo-detectors is oriented so the light from the first portion is projected onto the first photo-detector and light from the second portion is projected onto the second photo-detector. Light measured by the first photo-detector differs from light measured by the second photo-detector. The process further includes using the different first and the second photo-detector measurements to determine at least one from the group consisting of particle temperature and particle diameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.