Disk drive expediting defect scan when quality metric exceeds a more stringent threshold
US8014094B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 31, 2009 |
| Grant date | Sep 6, 2011 |
| Priority date | — |
| Expiry date | Dec 19, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/2516
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of data tracks. Data is read from one of the data tracks to generate a read signal, and a quality metric is generated in response to the read signal. When the quality metric exceeds a first threshold, a defect is detected in at least part of the data track. When the quality metric exceeds a second threshold different than the first threshold, the data track is reread to regenerate the quality metric, and when the quality metric exceeds the second threshold at least twice, the defect is detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.