System and method of defect description of a data storage medium
US8014245B2 · kind B2 · utility
5Cited by
13References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2007 |
| Grant date | Sep 6, 2011 |
| Priority date | — |
| Expiry date | Apr 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/2516
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The disclosure is directed toward systems and methods of defect description of a data storage medium. In a particular embodiment, a method includes determining a first defect of a data storage medium. The method also includes determining a format of an entry of a defect description table based on the first defect and a location of a second defect of the data storage medium. The format is selected from one of a plurality of formats. The method also includes storing a description of the first defect in the entry of the defect description table in the format.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.