Method of measuring deposition onto a substrate
US8015860B2 · kind B2 · utility
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1References
9Claims
0Family size
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Key dates
| Filing date | Jun 24, 2008 |
| Grant date | Sep 13, 2011 |
| Priority date | — |
| Expiry date | Nov 30, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/15
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the deposition of a composition onto a substrate. This information can be used to correlate how the composition will deposit on sanitary ware, such as shower cubicles, baths, and wash basins. The composition can be a liquid personal cleansing composition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.