Apparatus for measuring in-phase and quadrature (IQ) imbalance
US8018990B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 2008 |
| Grant date | Sep 13, 2011 |
| Priority date | — |
| Expiry date | Feb 26, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L27/3863
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.