Patent · US Active

Scalable interpoly dielectric stacks with improved immunity to program saturation

US8021948B2 · kind B2 · utility

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1References
8Claims
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Key dates

Filing dateDec 18, 2008
Grant dateSep 20, 2011
Priority date
Expiry dateDec 23, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/685

Abstract

A method for manufacturing a non-volatile memory device is described. The method comprises growing a layer in a siliconoxide consuming material, e.g. DyScO, on top of the upper layer of the layer where charge is stored. A non-volatile memory device is also described. In the non-volatile memory device, the interpoly/blocking dielectric comprises a layer in a siliconoxide consuming material, e.g. DyScO, on top of the upper layer of the layer where charge is stored, the siliconoxide consuming material having consumed at least part of the upper layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.