Method and system for analyzing signal waveforms
US8024142B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 20, 2007 |
| Grant date | Sep 20, 2011 |
| Priority date | — |
| Expiry date | Aug 14, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/2509
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for analyzing a signal waveform that comprises digitally sampling a signal at a periodic sampling interval, and accumulating a count of samples of the signal at a given logic level relative to a threshold value over a given period. The threshold value is stepped through a series of values while the accumulating of samples is repeated at a series of different clock offsets. The accumulated counts permit a statistical distribution of the signal waveform to be determined. A signal density can also be calculated by determining the difference between the count of adjacent samples at successive threshold values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.