Patent · US Active

Method and system for analyzing signal waveforms

US8024142B1 · kind B1 · utility

21Cited by
9References
7Claims
0Family size

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Key dates

Filing dateDec 20, 2007
Grant dateSep 20, 2011
Priority date
Expiry dateAug 14, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R19/2509
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and system for analyzing a signal waveform that comprises digitally sampling a signal at a periodic sampling interval, and accumulating a count of samples of the signal at a given logic level relative to a threshold value over a given period. The threshold value is stepped through a series of values while the accumulating of samples is repeated at a series of different clock offsets. The accumulated counts permit a statistical distribution of the signal waveform to be determined. A signal density can also be calculated by determining the difference between the count of adjacent samples at successive threshold values.

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