Abnormality detection frequency set when it is indicated that abnormality will occur
US8024622B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 16, 2009 |
| Grant date | Sep 20, 2011 |
| Priority date | — |
| Expiry date | Mar 19, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/0098
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The invention provides an information processing apparatus including: a plurality of abnormality detection sections provided in each of a plurality of detection target portions, that detect an abnormality caused by high temperature at a predetermined first frequency; an indication detecting section that detects an indication that the abnormality will occur; and a controller that controls to set the detection frequency of the plurality of abnormality detection sections to a second frequency which is higher than the first frequency, when the number of times that the indication is detected within a predetermined period is more than a predetermined number of times.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.