AFM tweezers, method for producing AFM tweezers, and scanning probe microscope
US8028567B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 20, 2008 |
| Grant date | Oct 4, 2011 |
| Priority date | — |
| Expiry date | Apr 20, 2030 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/962
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a triangular prism member provided so as to open/close with respect to the first probe, are provided. The first probe and the second probe are juxtaposed such that a predetermined peripheral surface of the triangular prism member of the first probe and a predetermined peripheral surface of the triangular prism member of the second probe face substantially in parallel to each other, and the first probe formed of a notch that prevents interference with a sample when the sample is scanned by the tip of the ridge.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.