Method for determining an influencing variable acting on the eccentricity in a goniometer
US8031334B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 6, 2007 |
| Grant date | Oct 4, 2011 |
| Priority date | — |
| Expiry date | Apr 21, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D18/001
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for determining at least one influencing variable acting on the eccentricity in a goniometer, using a detector arrangement consisting of four optical detector elements, and a rotational body comprising a plurality of pattern elements arranged around a pattern center, the rotational body being rotatably arranged about an axis. According to said method, at least some of the pattern elements are reproduced on the detector arrangement, the positions of the pattern elements reproduced on the detector arrangement are resolved, and the eccentricity of the pattern center in relation to a detector center of the detector arrangement is determined. A plurality of such eccentricity measurements for different rotational positions enables different influencing variables acting on the current eccentricity to be separated, especially by forming units.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.