Particle measurement systems and methods
US8031339B2 · kind B2 · utility
2Cited by
10References
36Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 15, 2008 |
| Grant date | Oct 4, 2011 |
| Priority date | — |
| Expiry date | Mar 30, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4709
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system according to one embodiment includes a light source for generating light fringes; a sampling mechanism for directing a particle through the light fringes; and at least one light detector for detecting light scattered by the particle as the particle passes through the light fringes. A method according to one embodiment includes generating light fringes using a light source; directing a particle through the light fringes; and detecting light scattered by the particle as the particle passes through the light fringes using at least one light detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.