Patent · US Active

Frequency-based approach for detection and classification of hard-disc defect regions

US8031420B2 · kind B2 · utility

12Cited by

7References

23Claims

0Family size

Assignee

LSI · US

Inventors

George Mathew · San Jose, US
Yang Han · Sunnyvale, US
Shaohua Yang · Santa Clara, US
Zongwang Li · San Jose, US
Yuan Xing Lee · San Jose, US

Key dates

Filing date	Feb 18, 2010
Grant date	Oct 4, 2011
Priority date	—
Expiry date	Feb 18, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG11B27/36
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

In a hard-disc drive read channel, frequency-based measures are generated at two different data frequencies (e.g., 2T and DC) by applying a transform, such as a discrete Fourier transform (DFT), to signal values, such as ADC or equalizer output values, corresponding to, e.g., a 2T data pattern stored on the hard disc. The frequency-based measures are used to detect defect regions on the hard disc and/or to classify defect regions as being due to either thermal asperity (TA) or drop-out media defect (MD).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.