Method and apparatus for analyzing quality traits of grain or seed
US8031910B2 · kind B2 · utility
18Cited by
15References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 27, 2004 |
| Grant date | Oct 4, 2011 |
| Priority date | — |
| Expiry date | Apr 30, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/1433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates generally to an apparatus for and a method of measuring and selecting grain for use in milling, or seed for use in plant breeding. Said method is adapted to optically analyze seeds/grains to qualitatively and quantitatively characterize the seed/grain, and more particularly, to analyze the gradation of color, whiteness, and hard endosperm of the seed/grain. This method and apparatus perform color image analysis of seed/grain sample(s) to characterize multiple quality traits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.