Methods for measuring at least one physical characteristic of a component
US8035094B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 20, 2009 |
| Grant date | Oct 11, 2011 |
| Priority date | — |
| Expiry date | Mar 31, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/89
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring the physical characteristics of a component includes associating a component with the system such that the component is positioned within the retention mount and operating the system to cause the light source to emit a collimated light beam along a source optical path, where the collimated light beam is reflected to cause a reflected collimated light beam to propagate along a sensor optical path to be incident upon the component to produce a component silhouette where the sensing device generates data responsive to the silhouette. The image data is processed to generate resultant data responsive to the component, wherein the resultant data is further responsive to at least one of a smoothing algorithm, a functional size algorithm and a centering algorithm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.