Measuring method and apparatus for potentiometric measuring probes
US8036841B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 12, 2008 |
| Grant date | Oct 11, 2011 |
| Priority date | — |
| Expiry date | Oct 26, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/4163
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and device are disclosed for measuring potentiometric measuring probes. An exemplary method includes feeding two test voltages comprising a harmonic wave Ueg with a base frequency fg and the harmonic wave Uer with a base frequency fr into two cores of a connecting cable through voltage source impedances, respectively. The voltage between an indicating electrode and a reference electrode, and the AC responding signal resulting from the two test voltages are passed to an amplifier and further to a transfer function unit having transfer functions (Hg, Hr), an A/D converter, and a Fourier transformation unit, to calculate a potential Ux and the two test responses Ug and Ur, respectively. Two calibration responses Uehg and Uehr are determined, wherein Uehg includes a product of Ueg and Hg, and wherein Uehr includes a product of Uer and Hr. Functional expressions are established for the test responses Ug and Ur, and the internal resistances Rg and Rr are determined by simultaneously solving equations having the unknown resistances Rg and Rr and capacitances C1 and C2. Accurate measurement of the internal resistance of the electrode can be achieved even with a relatively long con…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.