Test equipment for verification of crystal linearity at high-flux levels
US8039812B1 · kind B1 · utility
9Cited by
15References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 13, 2010 |
| Grant date | Oct 18, 2011 |
| Priority date | — |
| Expiry date | Apr 30, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2224/73265
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method and device that provides independent temperature control of x-ray detector crystals, either singly or in small groups. In addition to a thermal control network for the crystals, electronic devices are associated with each detector crystal and are independently cooled using Peltier devices so that lifetime and reliability are maximized. In most operating environments the ambient temperature is less than the operating temperature of the detector crystals. In these situations, the heat removed from the electronics can be used to heat the detector crystals, resulting in efficient operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.