Optical inspection of flat media using direct image technology
US8040502B2 · kind B2 · utility
7Cited by
7References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 19, 2005 |
| Grant date | Oct 18, 2011 |
| Priority date | — |
| Expiry date | Aug 10, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/896
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is directed at a method and system of detecting defects in a transparent media such as a piece of glass. The method comprises the steps of transmitting light from a light source towards the transparent media and then detecting defects in the transparent media by scanning the light as it is reflected or passes through the transparent media. The method and system may operate in any one of a dark field mode, a bright field mode for scanning or a bright field mode for inspecting.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.