Patent · US Active

Method and apparatus for time-based event correlation

US8041996B2 · kind B2 · utility

15Cited by

9References

20Claims

0Family size

Assignee

Alcatel Lucent · FR

Inventors

Dale Frank Rathunde · Geneva, US
Deepak Elandassery · Naperville, US
William E. Barker · Lewisville, US

Key dates

Filing date	Jan 11, 2008
Grant date	Oct 18, 2011
Priority date	—
Expiry date	Dec 26, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG06F2201/865
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and apparatus for fault analysis and fault isolation in a system of networked processors by using a central event correlation function and logical fault signature to provide for fault isolation of failed processing elements is presented. This central event correlation method uses asynchronous events from multiple input sources of same and different technologies and time-based fault correlation and ageing to match unique fault signatures and determine levels of fault recovery escalation over time. This mechanism uses an event driven recovery table to recognize a unique fault signature, count and age faults, provide fault threshold based recovery and generate events as needed to drive recovery escalation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.