Patent · US Active

Wipe sampling assembly

US8042414B2 · kind B2 · utility

0Cited by

7References

5Claims

0Family size

Assignee

NUCTECH COMPANY LIMITED · CN

Inventors

Hua Peng · Beijing, CN
Jianhua Liu · Orlando, US
Yangtian Zhang · Beijing, CN
Zhongxia Zhang · Beijing, CN
Wei Chen · Beijing, CN

Key dates

Filing date	Dec 22, 2008
Grant date	Oct 25, 2011
Priority date	—
Expiry date	Dec 17, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01N2001/028
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A wipe sampling assembly used for an ion mobility spectrometer is disclosed. The wipe sampling assembly comprises three layers in which the upper layer and the lower layer are protective paper sheets, while the middle layer is a sampling swab. The swab will not be contaminated when not in use as it is covered by the two protective paper sheets. The hand can only contact the protective paper and will not contact the swab while sampling to prevent the swab from being contaminated. The above wipe sampling assembly is used with no need for any additional device, thus making it easy to operate and carry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.