Method and system for desorbing and ionizing chemical compounds from surfaces
US8044346B2 · kind B2 · utility
37Cited by
16References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2007 |
| Grant date | Oct 25, 2011 |
| Priority date | — |
| Expiry date | May 9, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/142
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The invention relates to a method and system for ionizing analyte-containing sample lying on a surface of a substrate. The method comprises directing to the sample a heated flow of desorption gas in order to desorb analyte from the surface, and simultaneously directing to the sample light capable of ionizing the desorbed analyte in the presence of the desorption gas. The invention provides a method and system suitable for efficiently producing ions of neutral and nonpolar molecules on surfaces, for example for mass spectrometric purposes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.