Data quality tracking
US8046385B2 · kind B2 · utility
12Cited by
2References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 20, 2008 |
| Grant date | Oct 25, 2011 |
| Priority date | — |
| Expiry date | Sep 21, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/9024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In general, a method includes determining metric values associated with data quality for one or more child nodes. Metric values are determined for a parent node based on the metric values of at least some of the child nodes, and relationships between one or more parent nodes and one or more child nodes define a hierarchy. The determination of the metric value for the parent node is repeated for multiple instances.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.