Built-in self-test using embedded memory and processor in an application specific integrated circuit

US8046652B2 · kind B2 · utility

Assignee

• Marvell International Technology Ltd · BM

Inventors

• Richard D. Taylor · Eagle, US
• Mark D. Montierth · Meridian, US
• Melvin D. Bodily · Boise, US
• Gary D. Zimmerman · Garden Valley, US
• John D. Marshall · Montgomery, US

Key dates

• Filing date: Feb 15, 2011
• Grant date: Oct 25, 2011
• Expiry date: Feb 15, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G11B20/1816
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implement using a few terminals of the ASIC.