System and method for measuring resistivity parameters of an earth formation
US8050865B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2008 |
| Grant date | Nov 1, 2011 |
| Priority date | — |
| Expiry date | May 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein is a method of measuring a resistivity parameter of an earth formation. The method includes: applying a first electric measurement current including a first series of pulses to a first electrode and inducing a first formation current in the earth formation; applying a second electric measurement current including a second series of pulses to a second electrode and inducing a second formation current in the earth formation, the first series of pulses and the second series of pulses occupying distinct portions of a time domain in a selected time window; measuring the first measurement current, the first formation current, the second measurement current and the second formation current by coherent in-phase demodulation; and calculating at least one resistivity parameter by i) comparing the first measurement current to the first formation current and ii) comparing the second measurement current to the second formation current. A system for measuring a resistivity parameter of an earth formation is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.