Optimized case specific SPECT sampling
US8053735B2 · kind B2 · utility
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19Claims
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Key dates
| Filing date | Dec 19, 2008 |
| Grant date | Nov 8, 2011 |
| Priority date | — |
| Expiry date | May 21, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/00
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A method for improving single photon emission computed tomography by controlling acquisition parameters specific to the imaging goals and specific to the individual case under study. Data acquisition is modulated by scanning to adapt to the particular signal to noise characteristics of each object. A preliminary acquisition quickly scans the object of interest. The preliminary data is analyzed to optimize the secondary scan. The secondary scan is then acquired with optimized sampling of the object based on its own particular image characteristics. The system is able to learn, incorporating site specific data into a triaging set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.