Method of processing waveform data from one or more channels using a test and measurement instrument
US8055464B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 8, 2008 |
| Grant date | Nov 8, 2011 |
| Priority date | — |
| Expiry date | Oct 25, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/029
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The method of processing waveform data from one or more channels using a test and measurement instrument, such as an oscilloscope, is described in which waveform data is collected from a DUT; defining a context is defined by instructing the instrument to obtain the focus of each waveform datum having a first user-defined attribute; defining a selection criteria by instructing the instrument to obtain the focus of each waveform datum having both a first user-defined attribute and a second user-defined attribute; and defining an action by instructing the instrument to perform an operation responsive to finding at least one waveform datum having both the first user-defined attribute and the second user-defined attribute.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.