Learning classifiers for multiple-label data analysis
US8055593B2 · kind B2 · utility
2Cited by
5References
15Claims
0Family size
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Key dates
| Filing date | Oct 23, 2007 |
| Grant date | Nov 8, 2011 |
| Priority date | — |
| Expiry date | Oct 1, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16H50/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for multiple-label data analysis includes: obtaining labeled data points from more than one labeler; building a classifier that maximizes a measure relating the data points, labels on the data points and a predicted output label; and assigning an output label to an input data point by using the classifier.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.