Irradiation system including an electron-beam scanner
US8059783B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2010 |
| Grant date | Nov 15, 2011 |
| Priority date | — |
| Expiry date | Aug 31, 2030 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61N2005/1061
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A property of a treatment beam is controlled during a scanning period. A portion of a region is exposed to an imaging x-ray beam during a scanning period, the imaging x-ray beam being generated by an electron-beam scanner. X-ray radiation from the region is detected, the x-ray radiation representing an attenuation of the imaging x-ray beam caused by the portion of the region. A first image of the portion of the region is generated based on the detected x-ray radiation. A characteristic of the portion of the region is determined from the generated first image. An input derived from the characteristic is generated, the input configured to cause a source of a treatment beam to modify a property of the treatment beam. The source of the treatment beam modifies a property of the treatment beam during the scanning period by providing the input to the source of the treatment beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.