Semiconductor device and noise measuring method
US8060343B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 24, 2008 |
| Grant date | Nov 15, 2011 |
| Priority date | — |
| Expiry date | Mar 6, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a semiconductor device for outputting only the necessary information from non-periodic noise information to the outside. An analysis object information extracting section specifies analysis object information used to analyze noise associated with a malfunction from the non-periodic noise information having a large amount of information and extracts only the specified analysis object information from the noise information. A communication section outputs the extracted analysis object information to the outside. Thus, the amount of the information can be reduced and the noise information can be outputted by an inexpensive communication section such as a serial communication device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.