Patent · US Active

Error recovery within processing stages of an integrated circuit

US8060814B2 · kind B2 · utility

5Cited by
82References
9Claims
0Family size

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Key dates

Filing dateAug 21, 2009
Grant dateNov 15, 2011
Priority date
Expiry dateJul 1, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/183
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit includes a plurality of processing stages each including processing logic 1014, a non-delayed signal-capture element 1016, a delayed signal-capture element 1018 and a comparator 1024. The non-delayed signal-capture element 1016 captures an output from the processing logic 1014 at a non-delayed capture time. At a later delayed capture time, the delayed signal-capture element 1018 also captures a value from the processing logic 1014. An error detection circuit 1026 and error correction circuit 1028 detect and correct random errors in the delayed value and supplies an error-checked delayed value to the comparator 1024. The comparator 1024 compares the error-checked delayed value and the non-delayed value and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the error-checked delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propag…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.