System and process for ultrasonic characterization of deformed structures
US8061207B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 25, 2009 |
| Grant date | Nov 22, 2011 |
| Priority date | — |
| Expiry date | Jul 15, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N29/4418
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Generally speaking, the method of the present invention is performed by making various ultrasonic scans at preselected orientations along the length of a material being tested. Data from the scans are then plotted together with various calculated parameters that are calculated from this data. Lines or curves are then fitted to the respective plotted points. Review of these plotted curves allows the location and severity of defects within these sections to be determined and quantified. With this information various other decisions related to how, when or whether repair or replacement of a particular portion of a structure can be made.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.