Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same
US8063651B2 · kind B2 · utility
4Cited by
11References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 3, 2009 |
| Grant date | Nov 22, 2011 |
| Priority date | — |
| Expiry date | Jun 22, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R3/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact for an electrical test comprises a first area to be bonded to a board, a second area extending in the right-left direction from the lower end portion of the first area, a third area projecting downward from the tip end portion of the second area, and a low light reflective film having lower light reflectance than that of the first area. The third area has a probe tip to be contacted an electrode of an electronic device. The low light reflective film is formed on a surface of at least the bonding part of the first area to the board and its proximity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.