Method and apparatus for contactless determination of a lateral offset relative to a straight-ahead direction

US8064047B2 · kind B2 · utility

Assignee

• Kistler Holding AG · CH

Inventors

• Lukas Puellen · Gießen, DE
• Dietmar Kaul · Solms, DE
• Michael Robert Doerr · Hohenahr, DE

Key dates

• Filing date: Aug 13, 2009
• Grant date: Nov 22, 2011
• Expiry date: Aug 13, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B11/2755
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Method and apparatus for contactless determination of lateral offset relative to a straight-ahead direction when an object moves relative to an object with a stochastic surface structure, in which the surface structure is imaged on at least two similar photosensors arranged behind one another at a defined separation in the straight-ahead direction and having a spatially resolving longitudinal extent transverse to the straight-ahead direction, a spatial frequency signal corresponding to the surface structure is generated by the sensors, the spatial frequency signal of a second sensor in the movement direction is read, temporally shifted relative to the spatial frequency signal of the first sensor, such that the same, at least partially overlapping surface structure is imaged on both sensors, the spatial frequency signals of the first and second sensors are correlated to determine a correlation coefficient, and the lateral offset of the correlated spatial frequency signals on the sensors is determined.