System comprising a state-monitoring memory element

US8064281B2 · kind B2 · utility

Assignee

• Cypress Semiconductor Corporation · US

Inventors

• Michael Sheets · Poughkeepsie, US
• Timothy Williams · Bellevue, US

Key dates

• Filing date: Sep 19, 2007
• Grant date: Nov 22, 2011
• Expiry date: Jan 25, 2028

Classification

• Technology area (CPC —): General

Abstract

Embodiments of the invention relate to a state-monitoring memory element. The state-monitoring memory element may have a reduced ability to retain a logic state than other regular memory elements on an IC. Thus, if the state-monitoring memory elements fails or loses state during testing, it may be a good indicator that the IC's state retention may be in jeopardy, possibly requiring the IC to be reset. The state-monitoring memory element may be implemented by degrading an input voltage supply to the state-monitoring memory element across a diode and/or a transistor. One or more current sources may be used to stress the state-monitoring memory element. A logic analyzer may be used to analyze the integrity of the state-monitoring memory element and trigger appropriate actions in the IC, e.g., reset, halt, remove power, interrupt, responsive to detecting a failure in the state-monitoring memory element. Multiple state-monitoring memory elements may be distributed in different locations on the IC for better coverage.