Patent · US Active

Analysis of multidimensional data

US8064670B2 · kind B2 · utility

1Cited by
11References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 29, 2004
Grant dateNov 22, 2011
Priority date
Expiry dateOct 23, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30048
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Systems and methods are provided for analyzing a series of images. A contour initializer establishes a plurality of initial contours from respective images within the series of images. A model initializer interconnects the plurality of initial contours into a surface model. A model refiner refines the plurality of initial contours by manipulating the surface model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.