Patent · US Active

Method and device for investigation of a surface layer

US8067244B2 · kind B2 · utility

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10Claims
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Assignee

Inventors

Key dates

Filing dateNov 2, 2004
Grant dateNov 29, 2011
Priority date
Expiry dateDec 25, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/0873
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and device for investigation of a surface layer of a material. The material without surface layer is exposed for a gas and the penetration of the gas into the material is measured. Then the surface layer is applied to the material. Finally, the material including the surface layer is exposed for the gas and the penetration of the gas into the material through the surface layer is measured. The measurement of the passage of the gas into the material is performed by a method comprising measurement of light absorption by the gas by absorption spectroscopy.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.