Method and device for investigation of a surface layer
US8067244B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 2, 2004 |
| Grant date | Nov 29, 2011 |
| Priority date | — |
| Expiry date | Dec 25, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0873
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and device for investigation of a surface layer of a material. The material without surface layer is exposed for a gas and the penetration of the gas into the material is measured. Then the surface layer is applied to the material. Finally, the material including the surface layer is exposed for the gas and the penetration of the gas into the material through the surface layer is measured. The measurement of the passage of the gas into the material is performed by a method comprising measurement of light absorption by the gas by absorption spectroscopy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.