Methods and systems for the directing and energy filtering of X-rays for non-intrusive inspection
US8068582B2 · kind B2 · utility
0Cited by
18References
26Claims
0Family size
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Key dates
| Filing date | Feb 22, 2008 |
| Grant date | Nov 29, 2011 |
| Priority date | — |
| Expiry date | Mar 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods are disclosed herein for lenses based on crystal X-ray diffraction and reflection to be used to direct and energy filter X-ray beams.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.